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497AE - Dual/Triple Ultra-Low-Voltage SOT23 µP Supervisory Circuits TEST/JTAG SUPPORT|CMOS|QFP|48PIN|PLASTIC 测试/ JTAG支持|的CMOS | QFP封装| 48PIN |塑料

497AE_379156.PDF Datasheet

 
Part No. 497AE 1215E
Description Dual/Triple Ultra-Low-Voltage SOT23 µP Supervisory Circuits
TEST/JTAG SUPPORT|CMOS|QFP|48PIN|PLASTIC 测试/ JTAG支持|的CMOS | QFP封装| 48PIN |塑料

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 Full text search : Dual/Triple Ultra-Low-Voltage SOT23 µP Supervisory Circuits TEST/JTAG SUPPORT|CMOS|QFP|48PIN|PLASTIC 测试/ JTAG支持|的CMOS | QFP封装| 48PIN |塑料


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Vcc1: 1.665 V, Vcc2: 1.388 V, active timeout period: 140 ms-280 ms, dual/triple ultra-low-voltage SOT23 mP supervisor circuit
Vcc1: 2.313 V, Vcc2: 1.388 V, active timeout period: 140 ms-280 ms, dual/triple ultra-low-voltage SOT23 mP supervisor circuit
Vcc1: 2.188 V, Vcc2: 1.575 V, active timeout period: 140 ms-280 ms, dual/triple ultra-low-voltage SOT23 mP supervisor circuit
Vcc1: 2.313 V, Vcc2: 1.665 V, active timeout period: 140 ms-280 ms, dual/triple ultra-low-voltage SOT23 mP supervisor circuit
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Vcc1: 2.188 V, Vcc2: 0.788 V, active timeout period: 140 ms-280 ms, dual/triple ultra-low-voltage SOT23 mP supervisor circuit
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